https://pfspipe.ipmu.jp/jira This file is an XML representation of an issue en-us 8.3.4 803005 13-09-2019 https://pfspipe.ipmu.jp/jira/browse/INSTRM-562 Instrument control development <p>To recap various formal and non-formal conversations, here is the data set we would like taken after each instrument reconfiguration, cool down, or disassembly. And once a month in any case.</p> <p>In order:</p> <ul class="alternate" type="square"> <li>15 biases</li> <li>15 300s darks</li> <li>dithered flats, currently 20 roughly 0.3 pixel steps on each side of nominal. Three exposures at each position.</li> <li>5 flats at nominal position.</li> <li>5 Ne arcs, with peaks at 40k or so</li> <li>5 HgAr arcs peaks at 40k or so</li> <li>any other arc lamps, 5 exposures with peaks at 40k</li> </ul> INSTRM-562

Full reference data set

Task Normal Open Unresolved arnaud.lefur cloomis SM1 SPS Thu, 12 Oct 2017 15:31:24 +0000 Thu, 24 Feb 2022 20:36:42 +0000 Thu, 12 Oct 2017 15:31:24 +0000 0 4 <p>I was just chatting with Jim-sensei.</p> <p>I think we'd also like a set of in-focus images with the slit dithered by 1/2 a pixel in each direction (i.e. an extra 3 exposures with offsets (0.5, 0.0), (0.5, 0.5), (0.0, 0.5) in addition to the one at (0.0, 0.0)). </p> <p>The sampling is actually a bit worse than a factor of 2, but we don't think we need to routinely take data with 3x3 dithers. We may also ask for occasional dithers of out-of-focus data, but that needn't be added to the reference data set either.</p> Development Rank 0|zzst5g: