PFS-JIRA https://pfspipe.ipmu.jp/jira This file is an XML representation of an issue en-us 8.3.4 803005 13-09-2019 [INSTRM-258] Provide sequence to take defocused psf https://pfspipe.ipmu.jp/jira/browse/INSTRM-258 Instrument control development <p>We need to add a new sequence which take defocused arc on the full slit range (-5 -&gt; 5 mm)<br/> Exposure time need to be adjusted such as we optimize flux about 40,000 adu.</p> <p>We need to do it with at least hgar and neon to cover the full detector</p> INSTRM-258 Provide sequence to take defocused psf Task Normal Done Done arnaud.lefur arnaud.lefur Fri, 1 Dec 2017 02:41:44 +0000 Wed, 10 Jan 2018 14:06:11 +0000 Wed, 10 Jan 2018 14:06:11 +0000 ics_spsaitActor 0 2 <p><a href="https://pfspipe.ipmu.jp/jira/secure/ViewProfile.jspa?name=ncaplar" class="user-hover" rel="ncaplar">ncaplar</a> suggested that in that sequence, we dither and shift ( <a href="https://pfspipe.ipmu.jp/jira/browse/INSTRM-259" title="Provide sequence to improve sampling of the psf" class="issue-link" data-issue-key="INSTRM-259"><del>INSTRM-259</del></a>) for the focused exposure only.<br/> That's perfectly okay</p> <p>merged</p> Development Rank 0|ii03nb: