PFS-JIRA https://pfspipe.ipmu.jp/jira This file is an XML representation of an issue en-us 8.3.4 803005 13-09-2019 [INSTRM-1253] directly measure exposure and transient time in biasha firmware https://pfspipe.ipmu.jp/jira/browse/INSTRM-1253 Instrument control development <p>Update biasha firmware to measure exposure time directly.<br/> Also measure shutter transient time from the fast limit switches readings.<br/> Return both numbers along with the shutter close command. </p> INSTRM-1253 directly measure exposure and transient time in biasha firmware Task Normal Done Done arnaud.lefur arnaud.lefur Thu, 22 Apr 2021 15:36:01 +0000 Mon, 24 Jan 2022 16:50:49 +0000 Mon, 24 Jan 2022 16:50:49 +0000 ics_enu_bsh 0 1 <p>same as <a href="https://pfspipe.ipmu.jp/jira/browse/INSTRM-1504" title="add command to retrieve biasha firmware version" class="issue-link" data-issue-key="INSTRM-1504"><del>INSTRM-1504</del></a>, ready to be tested and validated.<br/> waiting for a test-board on the network.</p> Relates INSTRM-1254 Development Rank 0|02qpuc:i6001gr068fhw9qo4o0m38i Sprint SM1PD-2021 A8 SM1PD-2021 A9 SM1PD-2021 A10 SM1PD-2021 A 11 SM1PD-2022 A Story Points 2.0