[INSTRM-1253] directly measure exposure and transient time in biasha firmware Created: 23/Apr/21 Updated: 25/Jan/22 Resolved: 25/Jan/22 |
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| Status: | Done |
| Project: | Instrument control development |
| Component/s: | ics_enu_bsh |
| Affects Version/s: | None |
| Fix Version/s: | None |
| Type: | Task | Priority: | Normal |
| Reporter: | arnaud.lefur | Assignee: | arnaud.lefur |
| Resolution: | Done | Votes: | 0 |
| Labels: | SPS | ||
| Remaining Estimate: | Not Specified | ||
| Time Spent: | Not Specified | ||
| Original Estimate: | Not Specified | ||
| Issue Links: |
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| Story Points: | 2 | ||||||||
| Sprint: | SM1PD-2021 A8, SM1PD-2021 A9, SM1PD-2021 A10, SM1PD-2021 A 11, SM1PD-2022 A | ||||||||
| Description |
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Update biasha firmware to measure exposure time directly. |
| Comments |
| Comment by arnaud.lefur [ 15/Jan/22 ] |
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same as |